|The Thin Film Measurement App is specifically designed to measure the thickness of a single-layer film using the transfer matrix method and reflectance data. This app utilizes the principles of thin film interference and the transfer matrix formalism to calculate the thickness of the film based on the changes in reflectance at different wavelengths.
By analyzing the reflectance data obtained from the film, the app applies the transfer matrix method to model the optical behavior of the thin film. It considers the refractive indices and thickness of the film to determine the interference effects and calculate the film thickness accurately.
It is important to note that StellarNet also offers a separate software called StellarPro-TFC, specifically dedicated to the analysis of multi-layer thin films. This software provides advanced capabilities for the characterization and modeling of complex multi-layer thin film structures.
Thin Film Measurement App displays two plots in the Transmission graph: the measured transmission data and the calculated reflectance data.
By plotting both the measured transmission data and the calculated reflectance data on the graph, users can compare and assess the agreement between the experimental results and the theoretical predictions. This allows for the evaluation of the accuracy and reliability of the thin film measurement and analysis.
The Data window in the Thin Film Measurement App includes a functionality to find high correlation between the calculated reflectance and the measured reflectance. This correlation analysis assists in estimating the thickness of the film. To perform the measurement, click on the “Measure” button.
By comparing the calculated reflectance data, derived from the transfer matrix calculations, with the measured reflectance data obtained from the spectrometer, the app determines the degree of correlation between the two. It identifies the reflectance spectra that exhibit a strong correlation, indicating a closer match between the calculated and measured values.
Based on the highly correlated reflectance spectra, the app provides an estimation of the film thickness. This estimation takes into account the correlation analysis and allows users to determine the thickness of the thin film more accurately.