StellarSCOPE™ System for Microscopy
- Couple Spectrometers & Light Sources to high performance Microscopes
- Perform Raman, Fluorescence, & CIELAB color measurements on a micro spot and capture high resolution images, video, and time lapse video
- System equipped with an Olympus research microscope with 4, 10, & 40x objectives, CMOS 1.3 Mpixel Camera, optical switch, and required SMA couplers & attachment accessories for your specific application.
Microscopy Measurement System
StellarNet has released the StellarSCOPE™ System that allows users to couple their favorite StellarNet spectrometer systems to a microscope. This enables users to perform Raman, Fluorescence, & CIELAB color measurements on a micro spot and capture high resolution images, video, and time lapse video of their samples.
The StellarSCOPE System is a powerful add-on to your StellarNet spectroscopy system allowing for the most affordable Raman and fluorescence microscopy systems on the market. Configurations for multi-wavelength Raman spectroscopy are also available.
StellarSCOPE™ Microscopy Sample Spectra
Pharmaceuticals– Tablet fraction @ 4x zoom & Raman using StellarSCOPE System configured for 785nm Raman. SpectraWizID displays library match
Colorimetry of Gemstones – Qualitative color analysis using CIELAB, turquoise gemstones can be used for precise comparative analysis using dE color standards
Combined Systems– StellarSCOPE Systems allows for mix & match systems such as Multi-Wavelength Raman including 532/785/1064nm configurations
|StellarSCOPE||Microscope System with Accessories||$7,895|
|StellarScope System for Microscopy|
|Optical system||UIS2 (Universal Infinity-corrected) optical system|
|Illumination||Built-in transmitted Koehler illuminator 6V30W halogen bulb 100-120V/220-240Vg 0.85/0.45A 50/60Hz|
|Focusing||•Stage height movement by roller guide (rack & pinion) •Stroke per rotation: 36.8mm •Full stroke range: 25mm •Upper limit stopped by simplified pre-focusing dial •Tension adjustment on coarse focus adjustment knob|
|Measurement Stage||Size: 188(W) X 134(D)mm Movement range: 76mm X-direction X 50mm Y-direction Specimen holder, Double slide holder, Rubber grip Equipped as standard|
|Objectives||4, 10, 40x with working distance 18.5mm, 10.6mm, & 0.6mm|
|Camera||1.3 Megapixel resolution, image capture, video and time lapse video modes|
|Multi-Mode Feature||Easy adjustment switch between Camera Mode and Spectrometer Mode|
Free SpectraWiz® Software
The powerful SpectraWiz spectrometer software is provided free of charge with every spectrometer instrument. This includes drivers and customizable software for Windows. The SpectraWiz software is considered the “Swiss Army Knife of Spectroscopy” and may be used to accurately measure wavelength emissions, reflectance, transmission, absorption, concentrations, and absolute intensities. In addition to real-time spectroscopy, SpectraWiz® has built-in applications for SpectroRadiometry, SpectroColorimetry, ChemWiz chemistry lab concentration analyzer, and UV level monitors. Download SpectraWiz Software FREE
The Spectrawiz-ID application has been updated to allow users to save sample spectra to a specified library, then later perform a real time search using unknown samples to look for matches. This new feature works for Raman, NIR, or UV-VIS spectra using covariance mathematics to assign a correlation value and displays the top 10 library entries that qualify as a match.
CIELAB Color Application
- L*: Brightness (0 to 100)
- a*: Green (-a) to Red (+a)
- b*: Blue (-b) to Yellow (+b)
- Delta E* color difference
- X Y Z tristimulus
- xy chromaticity
- Select any illuminant (A-C,D50-D75,F1-F12)
- Compare samples to saved color standards
- Sample color values can be saved to text file
For more information about the FREE SpectraWiz® Software Suite & all our other customizable full source codes and programs click on the links below!
Technical Information Request
StellarNet, Inc. Tampa, Fl USA 10/15/2018 Array Detector Defects and Nonuniformities: All array detectors, both 1D and 2D, will inevitably suffer from defects and pixel-to-pixel nonuniformities due to the limitations of high-volume semiconductor manufacturing...read more