Optical Coating Measurement
Need an optical coating measurement solution? Our configurable thin film metrology systems deliver rapid, non-contact optical measurements for coating development, production verification, manufacturing, and quality control. Speak with our team to configure a system tailored to your application.
StellarNet Optical Coating Measurement Systems combine high-performance spectrometers, reflectance and transmission spectroscopy, modular optical accessories, and powerful analysis software to characterize coating thickness, reflectance, transmission, and overall optical performance. Designed for research, manufacturing, and quality control environments, these flexible systems support the measurement of lenses, mirrors, filters, laser optics, imaging systems, and other precision photonic components while ensuring product quality, manufacturing consistency, and compliance with design specifications.
Common Optical Coating Types
Optical coatings are engineered thin films that modify the reflection, transmission, and absorption of light. They are used to improve optical performance, reduce optical losses, and tailor wavelength response across lasers, imaging systems, sensors, scientific instruments, and precision photonic devices.
Common optical coating types include:
- Anti-Reflective (AR) Coatings – Maximize Light Transmission & Reduce Surface Reflections
- High-Reflectivity (HR) Mirror Coatings – Laser Cavities, Scientific Optics & Precision Mirrors
- Dielectric Coatings – Optical Performance, Spectral Control & Laser Optics
- Optical Filters (Bandpass, Longpass & Shortpass) – Wavelength Selection, Fluorescence & Spectroscopy
- Neutral Density (ND) Coatings – Controlled Optical Attenuation & Light Management
- Beam Splitter Coatings – Optical Power Distribution & Interferometry
- Protective & Hard Coatings – Scratch Resistance, Environmental Protection & Optical Durability
Key Optical Coating Measurements
Accurate optical coating measurement requires more than determining thin film thickness alone. Optical engineers evaluate multiple optical and material properties to optimize light transmission, reflectivity, wavelength response, spectral performance, and manufacturing consistency across anti-reflective coatings, dielectric mirrors, optical filters, beam splitters, and other precision optical components. Optical characterization helps verify coating performance, improve process control, and ensure compliance with demanding optical specifications.
Typical optical coating measurements include:
- Thin Film Thickness
- Reflectance
- Transmission
- Coating Uniformity
- Spectral Response
- Optical Constants (n & k)
- Optical Filter Characterization
- Laser Optics & Mirror Characterization
- Process Monitoring & Manufacturing Quality Control
Optical coating manufacturing workflow illustrating substrate preparation, cleaning, thin film deposition, multilayer optical coating deposition, process monitoring, optical coating characterization, component assembly, and final optical testing using StellarNet Thin Film Measurement Systems.
Applications for Optical Coating Measurement
Optical Bandpass Filter Measurement
Bandpass optical filters transmit a narrow range of wavelengths while blocking unwanted light. These precision multilayer coatings are commonly used in fluorescence microscopy, Raman spectroscopy, biomedical imaging, machine vision, astronomy, and analytical instrumentation. Spectroscopic reflectometry enables rapid, non-contact verification of multilayer filter structures, ensuring wavelength accuracy, optical performance, and manufacturing quality.
Typical Measured Stack
Air
SiO₂
TiO₂
SiO₂
TiO₂
Glass Substrate
Recommended Thin Film System: 350–1000 nm (TF-UVVIS)
High-Reflectivity (HR) Mirror Coating Measurement
High-reflectivity mirror coatings are engineered to maximize reflectance while minimizing optical losses at specific wavelengths. These multilayer dielectric coatings are commonly used in laser resonators, optical cavities, scientific instrumentation, spectroscopy systems, and aerospace optics. Spectroscopic reflectometry provides rapid, non-contact characterization of multilayer mirror coatings for process optimization and quality assurance.
Typical Measured Stack
Air
Ta₂O₅ / SiO₂ Multilayer Stack
Fused Silica (Bulk)
Recommended Thin Film System: 350–1000 nm (TF-UVVIS)
Dielectric Mirror Coating Measurement
Dielectric mirror coatings consist of alternating high- and low-refractive-index thin films that produce extremely high reflectivity over specific wavelength ranges. These multilayer coatings are widely used in laser cavities, scientific instruments, aerospace optics, optical communications, and precision photonic systems. Accurate layer thickness and optical characterization are essential for achieving the required reflectance, spectral response, and manufacturing consistency.
Typical Measured Stack
Air
Ta₂O₅ (~120 nm)
SiO₂ (~180 nm)
Ta₂O₅ (~120 nm)
SiO₂ (~180 nm)
Glass Substrate
Recommended Thin Film System: 350–1000 nm (TF-UVVIS)
Anti-Reflective (AR) Coating Measurement
Anti-reflective (AR) coatings are designed to minimize surface reflections and maximize light transmission through optical components. They are widely used on camera lenses, laser optics, microscopy systems, scientific instruments, machine vision systems, LiDAR sensors, and precision imaging optics. Precise film thickness is critical to achieving the desired wavelength response, reducing optical losses, and maximizing system performance. Spectroscopic reflectometry provides rapid, non-contact measurement of AR coatings for research, process development, and production quality control.
Typical Measured Stack
Air
SiO₂ (~2 nm)
Ta₂O₅ (~150 nm)
Fused Silica (Bulk)
Recommended Thin Film System: 350–1000 nm (TF-UVVIS)
StellarNet Recommended Thin Film Metrology Systems for Optical Coatings
Every optical coating application has unique measurement requirements. StellarNet’s modular thin film metrology platform allows users to configure complete measurement systems using UV-VIS spectrometers, reflectance and transmission fixtures, stabilized light sources, fiber optic probes, and advanced analysis software.
From anti-reflective coatings and optical filters to mirrors, beam splitters, and dielectric coatings, our flexible systems support research, process development, and production quality control. Our engineer-owned team works directly with customers to configure reliable, non-contact solutions tailored to their optical coating applications.
StellarNet TF™ Systems
StellarNet TF™ Systems combine reflectance spectroscopy, precision optics, and intuitive StellarPro™-TFC, Thin-Film Metrology software, to deliver accurate, non-destructive film thickness measurements from approximately 1 nm to 300 µm. The modular architecture allows laboratories to configure the ideal system today while providing a straightforward upgrade path for future automation and advanced measurement capabilities.
TF-Micro™
TF-Micro™ upgrades any compatible StellarNet TF™ System with a high-resolution microscope, enabling precision thin-film thickness measurements of microscopic features and small sample areas.
TF-Micro-AM
TF-Micro-AM™ adds programmable XY automation to compatible StellarNet TF™ Systems and TF-Micro™, enabling automated thickness mapping, repeatable positioning, and comprehensive measurement documentation for research and process development applications.
Thin Film Measurement Systems
| System | Range (nm) | Resolution | Thickness | Lamp type | Price |
|---|---|---|---|---|---|
TF-VIS | 400-1000 | <2nm | 10nm-75um | Visible/NIR | $11,500 |
| TF-UVVIS | 200-1100 | <2.5nm | 1nm-75um | UV + Visible/NIR | $14,625 |
| TF-NIR | 900-1700 | <5nm | 100nm-300um | Visible/NIR | $22,655 |
| TF-VIS-NIR | 400-1700 | <2nm, 5nm>1000nm | 10nm-300um | Visible/NIR | $25,280 |
| TF-UVVIS-NIR | 200-1700 | <2nm, 5nm>1000nm | 1nm-300um | UV + Visible/NIR | $28,245 |
| TF-Micro | StellarNet configured Microscope equipped with 4,10, & 40x objectives, CMOS 1.3 Mpixel Camera, optical switch, and required coupling accessories | $11,550.00 |
| TF-Micro-AM | StellarNet configured Auto-Mapping Microscope equipped with 4,10, & 40x objectives, CMOS 1.3 Mpixel Camera, optical switch, and required coupling accessories | $30,975.00 |
Thin Film System Specifications
| Precision | 0.1Å or 0.01% (greater of) |
| Accuracy | 0.2% or 10A (greater of) Film stack dependent |
| Stability | 0.2A or 0.02% (greater of) |
| Spot size | 3mm standard, optional down to 3 µm |
| Sample size | Sample size from 1 mm |
| Computer OS | StellarPro-TFC Software designed for 32 and 64-bit OS |
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