StellarNet Expands Display Thin-Film Measurement Systems

Jul 30, 2026 | Thin Film

StellarNet Expands Display Thin-Film Measurement Systems with New TF-Micro™ Thin-Film Measurement Microscope TF-AM™ Automated Mapping and Surface Quality Verification™ Delivering a Modular Thin-Film Metrology Solution for Display Research and...

StellarNet Expands Semiconductor Thin-Film Measurement Systems

Jul 30, 2026 | Thin Film

StellarNet Expands Semiconductor Thin-Film Measurement Systems with New TF-Micro™ Thin-Film Measurement Microscope TF-AM™ Automated Mapping and Surface Quality Verification ™ Extending a Modular Thin-Film Metrology Solution for Semiconductor...

StellarNet Expands Solar & Photovoltaic Thin-Film Measurement Systems

Jul 23, 2026 | Thin Film

StellarNet Expands Solar & Photovoltaic Thin-Film Measurement Systems with New TF-Micro™ Thin-Film Measurement MicroscopeTF-AM™Automated Mapping and Surface Quality Verification™ Delivering a Modular Thin-Film Metrology Solution for...

Horizontally Aligned Dipole Emission through Solvent Controlled Fusing of Perovskite Nanocubes and Nanoplates into 1D Nanowires

Jul 9, 2026 | Application, Optical Metrology, Thin Film, UV-VIS Absorption

G. G. Muley; Y. S. Tamgadge; P. P. Gedam; R. P. Ganorkar Abstract We report improved thermally stimulated third-order nonlinear optical coefficients (nonlinear refraction and nonlinear absorption) in thin films of Zn-doped CuS quantum dots (QDs) dispersed in a poly...

Photoluminescence Quantum Yield Enhancement of FAPbBr3 Thin Films via Ce Doping

Jul 9, 2026 | Application, Fluorescence, Optical Metrology, Thin Film, UV-VIS Absorption

Dmytro Vorontsov, Martin Ledinský, Aleš Vlk, Robert Hlaváč, Lucie Landová, Tereza Košutová, Karel Knížek, Anna Fučíková, Nada Mrkyvkova, Peter Siffalovic, Jan Valenta Abstract The photoluminescence (PL) and photoluminescence quantum yield (PLQY) of perovskite-based...

Optical Characterization

Jul 9, 2026 | Glossary of Spectroscopy Terms, Thin Film

Optical Characterization Optical characterization is the process of measuring how materials and thin films interact with light. Common optical measurements include reflectance, transmission, absorbance, refractive index, extinction coefficient, and film thickness,...