StellarNet Expands Display Thin-Film Measurement Systems with New TF-Micro™ Thin-Film Measurement Microscope TF-AM™ Automated Mapping and Surface Quality Verification™

Delivering a Modular Thin-Film Metrology Solution for Display Research and Manufacturing

TAMPA, Fla. — As display technologies continue to evolve—from OLED and MicroLED displays to LCDs, quantum dot displays, and emerging transparent display technologies—the ability to accurately characterize thin-film coatings has become increasingly important. Engineers developing next-generation displays require not only precise thin-film thickness measurements, but also measurement solutions that can evolve alongside new materials, deposition processes, and manufacturing requirements.

To support this growing need, StellarNet has expanded its thin-film metrology portfolio with the introduction of the TF-Micro™ Thin-Film Measurement Microscope, a modular microscope-based system designed for precision thin-film thickness measurements. Built on StellarNet’s modular instrumentation philosophy, the TF-Micro system allows laboratories to configure the capabilities they need today while providing a straightforward upgrade path as measurement requirements evolve.

Researchers interested in display coating characterization can learn more about Display Thin-Film Measurement Systems by visiting:
https://www.stellarnet.us/systems/thin-film-metrology/display-measurement/

The TF-Micro system combines high-resolution microscope imaging with StellarNet’s Thin-Film Metrology software to deliver accurate film thickness measurements. Laboratories can enhance the system over time with TF-AM™ Automated Mapping and Surface Quality Verification™, allowing the same instrument to support increasingly sophisticated measurement workflows without replacing the core system.

“Display materials continue to become thinner and more complex with every new generation of technology,” said Jason Pierce of StellarNet. “Our modular approach allows engineers to begin with the measurement capabilities they need today while providing a straightforward path to automation and advanced imaging workflows as their research and manufacturing processes evolve.”

TF-AM™ Automated Mapping

TF-AM™ Automated Mapping enhances the TF-Micro system by automating precision thin-film thickness measurements across user-defined grids, lines, and regions of interest. Instead of manually repositioning the sample for every measurement, engineers can automatically generate detailed thin-film thickness maps while recording:

Thin-film thickness
Optical reflectance spectra
Optical model calculations
Measurement coordinates
Complete measurement documentation

Automated mapping improves repeatability, increases measurement throughput, and provides a more comprehensive understanding of coating uniformity and process variation.

Surface Quality Verification™

Surface Quality Verification™ integrates microscope imaging directly into the measurement workflow, allowing users to visually verify and document each measurement location before collecting spectral data. The imaging workflow assists users in identifying visible surface conditions that may influence measurement quality, including:

Dust and particulate contamination
Fibers and lint
Hair and debris
Large droplets or surface residue
Sample edges
Sample fixtures or measurement obstructions
General measurement location suitability

By documenting the measurement area before analysis, researchers can improve confidence in their measurements while maintaining a permanent visual record of every analyzed location.

Designed for Advanced Display Materials

The TF-Micro system supports precision thin-film characterization across a broad range of display materials and coating technologies, including:

Indium Tin Oxide (ITO)
Transparent Conductive Oxides (TCOs)
Anti-Reflection Coatings
Hard Coatings
OLED Thin Films
MicroLED Structures
LCD Coatings
Quantum Dot Display Materials
Optical Adhesives
Display Glass Coatings
Experimental Display Materials

Depending on the selected configuration, users can perform precision manual measurements, automated mapping, imaging-assisted verification, or combine these capabilities within a common Thin-Film Metrology software environment.

A Modular Approach to Thin-Film Metrology

The TF-Micro family reflects StellarNet’s long-standing modular instrumentation philosophy. Rather than requiring laboratories to purchase a fully configured system, users can build a thin-film measurement solution around their current applications while maintaining a clear path for future expansion.

Researchers can begin with the core TF-Micro system and add TF-AM™Automated Mapping and Surface Quality Verification™as new measurement requirements emerge. This modular architecture protects existing investments, simplifies future upgrades, and allows laboratories to purchase only the capabilities that best support their workflow.

Whether performing routine thin-film thickness measurements, automated thickness mapping, or imaging-assisted measurement verification, users benefit from a common software platform, familiar workflows, and a flexible system designed to grow with their research and manufacturing needs.

Designed for Display Research and Manufacturing

The TF-Micro family is well suited for:

Display research laboratories
OLED development facilities
MicroLED process development
LCD manufacturing
University research laboratories
National laboratories
Process development laboratories
Advanced materials research
Industrial quality assurance

By combining optical spectroscopy, microscope imaging, automated mapping, and imaging-assisted verification within a common software environment, the TF-Micro family provides researchers with a flexible and expandable solution for precision thin-film characterization throughout the display product development cycle.

Additional Resources

Display Thin-Film Measurement Systems

https://www.stellarnet.us/systems/thin-film-metrology/display-measurement/

Thin-Film Metrology Systems

https://www.stellarnet.us/systems/thin-film-metrology/

About StellarNet

Since 1991, StellarNet has designed and manufactured modular miniature spectrometers, optical spectroscopy systems, and application-specific measurement solutions for scientific research, industrial process monitoring, quality assurance, and OEM integration. The company’s modular technologies support UV-Vis, NIR, Raman, fluorescence, radiometry, color measurement, microscopy, and thin-film metrology applications for researchers and manufacturers worldwide.

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