Wafer Metrology
Wafer Metrology Wafer metrology refers to the measurement and characterization of thin films, surface properties, and process parameters throughout semiconductor manufacturing. Accurate wafer metrology helps improve process control, increase manufacturing yield, and...Dielectric Thin Films
Dielectric Thin Films Dielectric thin films are electrically insulating materials used to control the reflection, transmission, and propagation of light. Silicon dioxide, silicon nitride, titanium dioxide, and tantalum pentoxide are among the most common dielectric...Transparent Conductive Oxides (TCOs)
Transparent Conductive Oxides (TCOs) Transparent conductive oxides (TCOs) are electrically conductive materials that maintain high optical transparency. Common TCOs include indium tin oxide (ITO) and aluminum-doped zinc oxide (AZO), which are widely used in displays,...Interference Fringes
Interference Fringes Interference fringes are the repeating peaks and valleys observed in reflected or transmitted spectra when light interacts with a thin film. The spacing and intensity of these fringes depend on film thickness, optical constants, wavelength, and...Optical Interference
Optical Interference Optical interference occurs when light reflected from multiple thin film interfaces combines to produce constructive and destructive interference patterns. These interference fringes contain valuable information about film thickness, refractive...
Introducing our new Applied Spectroscopy Division
New Handheld Raman!
New! ChemWiz-ADK Handheld NIR Spectrophotometer with on board chemometrics and spectral matching!
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Check out our SpectroChemistry Systems for UV-VIS and Fluorescence Applications
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New Spectrometer Python Application Driver
for Windows, Linux, RasPi, Mac
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HYPER-Nova Highest Performance Raman Spectrometer
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