Interference Fringes
Interference fringes are the repeating peaks and valleys observed in reflected or transmitted spectra when light interacts with a thin film. The spacing and intensity of these fringes depend on film thickness, optical constants, wavelength, and material structure, allowing engineers to precisely characterize thin films.
StellarNet Thin Film Measurement Systems capture high-quality spectral data and use sophisticated fitting algorithms to interpret interference fringes for accurate film thickness measurement across semiconductor, optical coating, solar, display, and photonic applications.
