Wafer Metrology
Wafer metrology refers to the measurement and characterization of thin films, surface properties, and process parameters throughout semiconductor manufacturing. Accurate wafer metrology helps improve process control, increase manufacturing yield, and verify device performance during fabrication.
StellarNet Thin Film Measurement Systems support wafer metrology by providing fast, non-contact optical measurement of oxide layers, dielectric films, photoresists, and other transparent thin films deposited on semiconductor wafers.
