Optical Characterization
Optical characterization is the process of measuring how materials and thin films interact with light. Common optical measurements include reflectance, transmission, absorbance, refractive index, extinction coefficient, and film thickness, providing critical information for product development and quality assurance.
StellarNet Thin Film Measurement Systems combine high-performance spectrometers, modular optical hardware, and advanced thin film analysis software to deliver comprehensive optical characterization for semiconductor, photovoltaic, display, optical coating, and photonic device applications.




