Thin Film & Optical Coating Measurement
Featured Articles
Solar Cell Thin Film Thickness Measurement
Accurate thin film measurement is essential in solar and photovoltaic manufacturing to maximize energy conversion, coating performance, and production quality. Thin photovoltaic layers, transparent conductive oxides, and anti-reflective coatings directly influence solar cell efficiency and long-term device reliability.
Display Thin Film Measurement Applications
Accurate display technology measurement is essential for developing high-performance displays with exceptional brightness, color accuracy, transparency, and long-term reliability. Thin conductive, optical, and protective films directly influence display performance across OLED, LCD, MicroLED, and other advanced display technologies.
Advanced Photonics Thin Film Measurement Applications
Advanced photonic devices require precise optical characterization to optimize light propagation, reduce losses, and improve device performance. Optical coatings, waveguides, photonic integrated circuits (PICs), and laser components all depend on accurate measurement to support development and manufacturing.
Customer Research & Publications
Multilayer Thin Films
Multilayer Thin Films Many advanced optical and electronic devices contain multiple thin film layers, each engineered to perform a specific optical or electrical function. These multilayer stacks...
Thin Film Modeling
Thin Film Modeling Thin film modeling is the process of mathematically simulating how light interacts with one or more thin film layers. By comparing measured spectra with theoretical optical...
Horizontally Aligned Dipole Emission through Solvent Controlled Fusing of Perovskite Nanocubes and Nanoplates into 1D Nanowires
Mounika Dudala, Leonna Gaither, Carissa N. Eisler Abstract Colloidal lead halide perovskite nanocrystals (NCs) are a promising class of materials for light-emitting applications, yet their external...
Broadband reflective circular dichroism in the visible-light region from an aluminum chiral metasurface fabricated with a lift-off-free double-layer structure
Atsushi Motogaito, Ryune Fukushi, Yoshiki Takeshima, Kotaro Ito, Takeshi Kato & Kazumasa Hiramatsu Abstract We experimentally and numerically investigate an aluminum (Al) chiral metasurface...
Energy-Harvesting Asymmetry in Semitransparent Polymer Solar-Cells Based on a Laminated Transparent Electrode
Changhun Yun; Moon Hee Kang Abstract Semitransparent polymer solar cells (ST-PSCs) with laminated transparent electrodes are promising candidates for building-integrated photovoltaics. However, the...
Wideband nanocomposite antireflective coating based on aluminium dry powder nanoparticles embedded into a photopolymer matrix for solar cells application
P. A. Sánchez, S. Valdueza-Felip, M. Sun, F. B. Naranjo & Ó. Esteban Abstract We present a low-cost method to implement a single-layer antireflective coating (ARC) including metallic...
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Explore thin film metrology through practical guides, application notes, videos, technical resources, and real-world research. From understanding thin film thickness measurement to exploring optical coatings, reflectance and transmission, and advanced materials, the Thin Film Learning Center provides resources to help you better understand measurement techniques and get more from your thin film analysis.
- Guides & Technical Resources — Learn about measurement techniques, optical characterization, and thin film analysis.
- Application Notes & Research — See how thin film metrology is used across semiconductors, solar, displays, coatings, and advanced materials.
- Videos, Software & Tools — Explore demonstrations, software resources, technical documents, and measurement tips.


