Optical Interference
Optical interference occurs when light reflected from multiple thin film interfaces combines to produce constructive and destructive interference patterns. These interference fringes contain valuable information about film thickness, refractive index, and layer structure, making optical interference the foundation of many non-contact thin film measurement techniques.
StellarNet Thin Film Measurement Systems analyze these interference patterns using broadband spectroscopy and advanced optical models to accurately determine film thickness and optical properties without contacting or damaging the sample.
