Thin Film & Optical Coating Measurement
Featured Articles
Solar Cell Thin Film Thickness Measurement
Accurate thin film measurement is essential in solar and photovoltaic manufacturing to maximize energy conversion, coating performance, and production quality. Thin photovoltaic layers, transparent conductive oxides, and anti-reflective coatings directly influence solar cell efficiency and long-term device reliability.
Display Thin Film Measurement Applications
Accurate display technology measurement is essential for developing high-performance displays with exceptional brightness, color accuracy, transparency, and long-term reliability. Thin conductive, optical, and protective films directly influence display performance across OLED, LCD, MicroLED, and other advanced display technologies.
Advanced Photonics Thin Film Measurement Applications
Advanced photonic devices require precise optical characterization to optimize light propagation, reduce losses, and improve device performance. Optical coatings, waveguides, photonic integrated circuits (PICs), and laser components all depend on accurate measurement to support development and manufacturing.
Customer Research & Publications
StellarNet Expands Display Thin-Film Measurement Systems
StellarNet Expands Display Thin-Film Measurement Systems with New TF-Micro™ Thin-Film Measurement Microscope TF-AM™ Automated Mapping and Surface Quality Verification™...
StellarNet Expands Semiconductor Thin-Film Measurement Systems
StellarNet Expands Semiconductor Thin-Film Measurement Systems with New TF-Micro™ Thin-Film Measurement Microscope TF-AM™ Automated Mapping and Surface Quality Verification ™ ...
StellarNet Expands Solar & Photovoltaic Thin-Film Measurement Systems
StellarNet Expands Solar & Photovoltaic Thin-Film Measurement Systems with New TF-Micro™ Thin-Film Measurement MicroscopeTF-AM™Automated Mapping and Surface Quality...
Horizontally Aligned Dipole Emission through Solvent Controlled Fusing of Perovskite Nanocubes and Nanoplates into 1D Nanowires
G. G. Muley; Y. S. Tamgadge; P. P. Gedam; R. P. Ganorkar Abstract We report improved thermally stimulated third-order nonlinear optical coefficients (nonlinear refraction and nonlinear absorption)...
Photoluminescence Quantum Yield Enhancement of FAPbBr3 Thin Films via Ce Doping
Dmytro Vorontsov, Martin Ledinský, Aleš Vlk, Robert Hlaváč, Lucie Landová, Tereza Košutová, Karel Knížek, Anna Fučíková, Nada Mrkyvkova, Peter Siffalovic, Jan Valenta Abstract The photoluminescence...
Optical Characterization
Optical Characterization Optical characterization is the process of measuring how materials and thin films interact with light. Common optical measurements include reflectance, transmission,...
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Explore thin film metrology through practical guides, application notes, videos, technical resources, and real-world research. From understanding thin film thickness measurement to exploring optical coatings, reflectance and transmission, and advanced materials, the Thin Film Learning Center provides resources to help you better understand measurement techniques and get more from your thin film analysis.
- Guides & Technical Resources — Learn about measurement techniques, optical characterization, and thin film analysis.
- Application Notes & Research — See how thin film metrology is used across semiconductors, solar, displays, coatings, and advanced materials.
- Videos, Software & Tools — Explore demonstrations, software resources, technical documents, and measurement tips.