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Advanced & Quantum Materials

Materials spectroscopy helps researchers investigate the optical and chemical properties of materials at the forefront of modern research. StellarNet systems support studies of quantum materials and emerging technologies where detailed spectral measurements are essential. Perovskites, graphene, and other 2D materials can be studied to better understand their behavior and performance. Spectroscopy also provides valuable insight into nanomaterials, semiconductors, and photonic materials. From fluorescence to broader optical characterization, StellarNet gives university and research laboratories flexible tools for exploring new materials and developing the technologies built around them.

Featured Articles

Illuminating Quantum Photonics with High-Performance Spectrometers

Quantum photonics relies on precise characterization of light from single-photon sources, quantum dots, integrated photonic circuits, and other emerging devices. Explore how high-resolution spectroscopy can help researchers measure spectral purity, emission wavelengths, resonances, and weak signals across a range of quantum photonics applications.

Decorating Graphene Oxide with Green Silver Nanoparticles

Researchers are exploring new ways to modify graphene oxide nanosheets with metal nanoparticles for advanced material applications. This study demonstrates a simple one-pot approach for decorating graphene oxide with green-synthesized silver nanoparticles, using UV-VIS absorption spectroscopy to investigate the resulting nanomaterials

Characterizing Graphene with Cost-Effective Raman Spectroscopy

Raman spectroscopy provides valuable insight into graphene’s structure, defects, and layer thickness through its characteristic D, G, and 2D bands. This application explores practical considerations for graphene analysis and demonstrates how a more cost-effective Raman system can support material characterization without relying on expensive Raman microscopy platforms.

Customer Research & Publications

Key Application Areas

Food Safety & Quality

Astronomy, Space & Remote Sensing

Thin Films & Optical Coatings

Pharmaceuticals & Nutraceuticals

Biomedical & Life Sciences

Environmental & Microplastics

Industrial & Process Analysis

Lighting, Displays & Radiometry

products & systems

Raman Systems

Compact and flexible Raman systems for material identification and characterization. Ideal for researchers studying advanced materials, including graphene, nanomaterials, and semiconductors. Available in configurations suited for laboratory research and specialized measurement setups.

Thin-Film Systems

Flexible and precise thin film systems for measuring film thickness and optical properties. Ideal for researchers working with advanced materials, coatings, semiconductors, and emerging technologies. Designed for laboratory research and specialized measurement setups where accurate film characterization is essential.

Radiometer Systems

Flexible radiometers for measuring and characterizing light across a wide range of research applications. Ideal for studying optical properties, light sources, and material responses. Available in configurations suited for laboratory research and specialized measurement setups.

Learn More

Explore spectroscopy and optical measurement through practical guides, application notes, videos, technical resources, and real-world research. Learn the fundamentals of spectroscopy while exploring techniques for material analysis, thin film measurement, and Raman characterization. These Learning Centers bring together educational content and practical resources to help researchers and engineers understand their measurements and make the most of their spectroscopy systems.

  • Raman Learning Center — Discover Raman spectroscopy for material identification, molecular analysis, and research applications.
  • Spectrometers Learning Center — Explore spectroscopy fundamentals, measurement techniques, applications, and practical resources.
  • Thin Film Learning Center — Learn about film thickness, optical coatings, reflectance, transmission, and thin film metrology.
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