Advanced & Quantum Materials
Featured Articles
Illuminating Quantum Photonics with High-Performance Spectrometers
Quantum photonics relies on precise characterization of light from single-photon sources, quantum dots, integrated photonic circuits, and other emerging devices. Explore how high-resolution spectroscopy can help researchers measure spectral purity, emission wavelengths, resonances, and weak signals across a range of quantum photonics applications.
Decorating Graphene Oxide with Green Silver Nanoparticles
Researchers are exploring new ways to modify graphene oxide nanosheets with metal nanoparticles for advanced material applications. This study demonstrates a simple one-pot approach for decorating graphene oxide with green-synthesized silver nanoparticles, using UV-VIS absorption spectroscopy to investigate the resulting nanomaterials
Characterizing Graphene with Cost-Effective Raman Spectroscopy
Raman spectroscopy provides valuable insight into graphene’s structure, defects, and layer thickness through its characteristic D, G, and 2D bands. This application explores practical considerations for graphene analysis and demonstrates how a more cost-effective Raman system can support material characterization without relying on expensive Raman microscopy platforms.
Customer Research & Publications
Subwavelength Plasmonic Color Tuning of Quantum Dot Emission
Darren C. J. NeoDarren C. J. Neo Institute of Materials Research and Engineering, 2 Fusionopolis Way, Innovis, #08-03, Singapore 138634 More by Darren C. J. Neo, Chengyuan Yang, Yi Shi, Qing Yang...
Hybrid vanadium dioxide-liquid crystal tunable non-reciprocal scattering metamaterial smart window for visible and infrared radiation control
P. Lakshmi Madhuri, Saranya Bhupathi, S. Shuddhodana, Zaher M. A. Judeh, Sheng-Hsiung Yang, Yi Long, and Ibrahim Abdulhalim Abstract Smart windows based on VO2 can control the infrared radiation...
Influence of thickness of poly(3-hexylthiophene-2,5-diyl) hole transport layer on electrical characteristics of lead sulfide quantum dot-based shortwave infrared photodiodes
Kyeong-Ho Seo, Xue Zhang, Sungkeun Baang, Jaehoon Park & Jin-Hyuk Bae Abstract Lead sulfide quantum dots (PbS QDs) have emerged as one of the promising photoactive materials for shortwave...
Beneficial stilbene-based derivatives: From the synthesis of new catalytic photosensitizer to 3D printouts and fiber-reinforced composites
Wiktoria Tomal, Dominika Krok, Anna Chachaj-Brekiesz, Joanna Ortyla Abstract New meta- and para-cyanoderivatives of 1,4-di(styryl)benzene and 1,3-di(styryl)benzene were synthesized and investigated...
Photoluminescence spectra of point defects in semiconductors: validation of first principles calculations
Yu Jin, Marco Govoni, Gary Wolfowicz, Sean E. Sullivan, F. Joseph Heremans, David D. Awschalom, and Giulia Galli Abstract Optically and magnetically active point defects in semiconductors are...
The Polarization of Laser Generation from the Cholesteric Liquid Crystal–Dye-Doped Polymer Layer–Cholesteric Liquid Crystal System
T. M. Sarukhanyan Abstract The state of polarization is an important feature of any laser emission. The polarization of light is important for the processing of laser beams in...
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Explore spectroscopy and optical measurement through practical guides, application notes, videos, technical resources, and real-world research. Learn the fundamentals of spectroscopy while exploring techniques for material analysis, thin film measurement, and Raman characterization. These Learning Centers bring together educational content and practical resources to help researchers and engineers understand their measurements and make the most of their spectroscopy systems.
- Raman Learning Center — Discover Raman spectroscopy for material identification, molecular analysis, and research applications.
- Spectrometers Learning Center — Explore spectroscopy fundamentals, measurement techniques, applications, and practical resources.
- Thin Film Learning Center — Learn about film thickness, optical coatings, reflectance, transmission, and thin film metrology.