Thin Film & Optical Coating Measurement
Featured Articles
Solar Cell Thin Film Thickness Measurement
Accurate thin film measurement is essential in solar and photovoltaic manufacturing to maximize energy conversion, coating performance, and production quality. Thin photovoltaic layers, transparent conductive oxides, and anti-reflective coatings directly influence solar cell efficiency and long-term device reliability.
Display Thin Film Measurement Applications
Accurate display technology measurement is essential for developing high-performance displays with exceptional brightness, color accuracy, transparency, and long-term reliability. Thin conductive, optical, and protective films directly influence display performance across OLED, LCD, MicroLED, and other advanced display technologies.
Advanced Photonics Thin Film Measurement Applications
Advanced photonic devices require precise optical characterization to optimize light propagation, reduce losses, and improve device performance. Optical coatings, waveguides, photonic integrated circuits (PICs), and laser components all depend on accurate measurement to support development and manufacturing.
Customer Research & Publications
Polarized Emission from Conjugated Polymer Chains Aligned by Epitaxial Growth during Off-Center Spin-Coating
T Anzai, W Porzio, V Vohraa Due to their macromolecular nature, conjugated polymers can be relatively easily aligned by applying a variety of processes resulting in either elongation or ordering of...
ZnO film deposition by DC magnetron sputtering: Effect of target configuration on the film properties
E Arakelova, A Khachatryan, A Kteyan, K Avjyan… - Thin Solid Films, 2016 Ballistic transport model for target-to-substrate atom transfer during magnetron sputter deposition was used to develop zinc...
Influence of doping behavior of Al on nanostructure, morphology and optoelectronic properties of Al Doped ZnO thin film grown on FTO substrate
M Shirazi, RS Dariani, MR Toroghinejad - Journal of Materials Science Al doped ZnO nanostructures deposited on FTO glass substrate by spray pyrolysis method with different Al doping levels...
Formation mechanism of toxic-element-free oxide layer on Ti–6Al–4V alloy in d.c. glow discharge plasma with pure oxygen gas
K Satoh, S Sato, K Wagatsuma - Surface and Coatings Technology, 2016 The purpose of this study is to elucidate the formation mechanism of a toxic-element-free oxide layer on a Ti–6Al–4V alloy by...
Spectral dependence of photoinduced optical effects in As 40 S 60-x Se x thin films
I Voynarovych, J Buzek, K Palka, M Vlcek - Thin Solid Films, 2016 Spectral dependence of photoinduced structural transformation and related changes ofEgopt, α and n of thermally evaporated ternary...
Limitations of high pressure sputtering for amorphous silicon deposition
R García-Hernansanz, E García-Hemme, D Montero… - Materials Research Express, 2016 Amorphous silicon thin films were deposited using the high pressure sputtering (HPS) technique to study the...
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Explore thin film metrology through practical guides, application notes, videos, technical resources, and real-world research. From understanding thin film thickness measurement to exploring optical coatings, reflectance and transmission, and advanced materials, the Thin Film Learning Center provides resources to help you better understand measurement techniques and get more from your thin film analysis.
- Guides & Technical Resources — Learn about measurement techniques, optical characterization, and thin film analysis.
- Application Notes & Research — See how thin film metrology is used across semiconductors, solar, displays, coatings, and advanced materials.
- Videos, Software & Tools — Explore demonstrations, software resources, technical documents, and measurement tips.