Jul 9, 2026 | Glossary of Spectroscopy Terms, Thin Film
Transparent Conductive Oxides (TCOs) Transparent conductive oxides (TCOs) are electrically conductive materials that maintain high optical transparency. Common TCOs include indium tin oxide (ITO) and aluminum-doped zinc oxide (AZO), which are widely used in displays,...
Jul 9, 2026 | Glossary of Spectroscopy Terms, Thin Film
Interference Fringes Interference fringes are the repeating peaks and valleys observed in reflected or transmitted spectra when light interacts with a thin film. The spacing and intensity of these fringes depend on film thickness, optical constants, wavelength, and...
Jul 9, 2026 | Glossary of Spectroscopy Terms, Thin Film
Optical Interference Optical interference occurs when light reflected from multiple thin film interfaces combines to produce constructive and destructive interference patterns. These interference fringes contain valuable information about film thickness, refractive...
Jul 9, 2026 | Glossary of Spectroscopy Terms, Thin Film
Multilayer Thin Films Many advanced optical and electronic devices contain multiple thin film layers, each engineered to perform a specific optical or electrical function. These multilayer stacks may include oxides, nitrides, transparent conductive oxides, dielectric...
Jul 9, 2026 | Glossary of Spectroscopy Terms, Thin Film
Thin Film Modeling Thin film modeling is the process of mathematically simulating how light interacts with one or more thin film layers. By comparing measured spectra with theoretical optical models, engineers can determine film thickness, refractive index, extinction...
Jul 9, 2026 | Glossary of Spectroscopy Terms
Thin Film Metrology Thin film metrology is the science of measuring the physical and optical properties of thin films deposited on a substrate. Engineers use thin film metrology to determine film thickness, refractive index, extinction coefficient, reflectance,...