Thin Film Metrology
Thin film metrology is the science of measuring the physical and optical properties of thin films deposited on a substrate. Engineers use thin film metrology to determine film thickness, refractive index, extinction coefficient, reflectance, transmission, and multilayer structure during research, product development, and manufacturing quality control. Accurate metrology is essential for semiconductor devices, optical coatings, displays, photovoltaic materials, and photonic components.
StellarNet Thin Film Measurement Systems use non-contact optical reflectance and transmission spectroscopy to rapidly characterize single-layer and multilayer thin film structures. Configurable wavelength ranges, modular hardware, and advanced optical modeling enable engineers to optimize measurements for a wide variety of materials and applications.
