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Thin Film Metrology

Thin Film Metrology Thin film metrology is the science of measuring the physical and optical properties of thin films deposited on a substrate. Engineers use thin film metrology to determine film thickness, refractive index, extinction coefficient, reflectance,...

World Brain Day

View UV-VIS Spectrometers UV-VIS Learning Center On July 22nd, World Brain Day is observed globally. Established by the World Federation of Neurology, the day is meant to raise awareness about brain health and neurological disorders. The brain is a remarkably complex...

Space Exploration Day

View our Spectrometer Lineup Spectrometer Learning Center Research Spotlight : Enabling the Next Generation of Planetary Atmospheric Spectroscopy Space exploration has entered a new era of compact, collaborative spacecraft. As CubeSat technology continues to mature,...

Spectroscopy and the Perfect Pitch

View Radiometers Radiometers Learning Center Before the first whistle blows at the soccer match, spectroscopy is already at work. By measuring the light reaching the turf canopy, researchers using StellarNet spectrometers uncovered how healthy grass naturally limits...
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