StellarNet Expands Semiconductor Thin-Film Measurement Systems
StellarNet Expands Semiconductor Thin-Film Measurement Systems with New TF-Micro™ Thin-Film Measurement Microscope TF-AM™ Automated Mapping and Surface Quality Verification ™ Extending a Modular Thin-Film Metrology Solution for Semiconductor...National Ice Cream Month
View Industrial Analyzers Industrial Analyzers Learning Center Near-Infrared (NIR) spectroscopy (NIR Spectrometers) is a valuable tool for quality control in the production of soft serve ice cream powders. It offers several advantages for measuring various quality...Optical Characterization
Optical Characterization Optical characterization is the process of measuring how materials and thin films interact with light. Common optical measurements include reflectance, transmission, absorbance, refractive index, extinction coefficient, and film thickness,...Optical Filter
Optical Filter Optical filters selectively transmit or block specific wavelengths of light and are widely used in spectroscopy, fluorescence microscopy, machine vision, laser systems, telecommunications, and scientific instrumentation. Their optical performance...
Introducing our new Applied Spectroscopy Division
New Handheld Raman!
New! ChemWiz-ADK Handheld NIR Spectrophotometer with on board chemometrics and spectral matching!
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Check out our SpectroChemistry Systems for UV-VIS and Fluorescence Applications
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New Spectrometer Python Application Driver
for Windows, Linux, RasPi, Mac
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HYPER-Nova Highest Performance Raman Spectrometer
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