Jul 9, 2026 | Application, Fluorescence, Optical Metrology, Thin Film, UV-VIS Absorption
Dmytro Vorontsov, Martin Ledinský, Aleš Vlk, Robert Hlaváč, Lucie Landová, Tereza Košutová, Karel Knížek, Anna Fučíková, Nada Mrkyvkova, Peter Siffalovic, Jan Valenta Abstract The photoluminescence (PL) and photoluminescence quantum yield (PLQY) of perovskite-based...
Jul 8, 2026 | Application, Optical Metrology, Thin Film, UV-VIS Absorption
Mounika Dudala, Leonna Gaither, Carissa N. Eisler Abstract Colloidal lead halide perovskite nanocrystals (NCs) are a promising class of materials for light-emitting applications, yet their external quantum efficiency in devices is limited by isotropic dipole...
Jul 7, 2026 | Application, Optical Metrology, Reflectance, Thin Film, Transmission, UV-VIS Absorption
Atsushi Motogaito, Ryune Fukushi, Yoshiki Takeshima, Kotaro Ito, Takeshi Kato & Kazumasa Hiramatsu Abstract We experimentally and numerically investigate an aluminum (Al) chiral metasurface exhibiting broadband reflective circular dichroism (RCD) in the visible....
Jul 6, 2026 | Application, Optical Metrology, Reflectance, Thin Film, Transmission, UV-VIS Absorption
Changhun Yun; Moon Hee Kang Abstract Semitransparent polymer solar cells (ST-PSCs) with laminated transparent electrodes are promising candidates for building-integrated photovoltaics. However, the optical mechanisms governing their bidirectional performance remain...
Jul 2, 2026 | Application, Optical Metrology, Reflectance, Thin Film, Transmission, UV-VIS Absorption
P. A. Sánchez, S. Valdueza-Felip, M. Sun, F. B. Naranjo & Ó. Esteban Abstract We present a low-cost method to implement a single-layer antireflective coating (ARC) including metallic nanoparticles embedded into a polymer matrix. This ARC shows an almost flat...