Jul 9, 2026 | Advanced & Quantum Materials, Application, Applications, Optical Metrology, Thin Film, UV-VIS Absorption
G. G. Muley; Y. S. Tamgadge; P. P. Gedam; R. P. Ganorkar Abstract We report improved thermally stimulated third-order nonlinear optical coefficients (nonlinear refraction and nonlinear absorption) in thin films of Zn-doped CuS quantum dots (QDs) dispersed in a poly...
Jul 8, 2026 | Advanced & Quantum Materials, Application, Optical Metrology, Thin Film, UV-VIS Absorption
Mounika Dudala, Leonna Gaither, Carissa N. Eisler Abstract Colloidal lead halide perovskite nanocrystals (NCs) are a promising class of materials for light-emitting applications, yet their external quantum efficiency in devices is limited by isotropic dipole...
Jul 7, 2026 | Advanced & Quantum Materials, Application, Applications, Optical Metrology, Reflectance, Thin Film, Transmission, UV-VIS Absorption
Atsushi Motogaito, Ryune Fukushi, Yoshiki Takeshima, Kotaro Ito, Takeshi Kato & Kazumasa Hiramatsu Abstract We experimentally and numerically investigate an aluminum (Al) chiral metasurface exhibiting broadband reflective circular dichroism (RCD) in the visible....
Jul 6, 2026 | Application, Applications, Optical Metrology, Reflectance, Thin Film, Thin Film, Transmission, UV-VIS Absorption
Changhun Yun; Moon Hee Kang Abstract Semitransparent polymer solar cells (ST-PSCs) with laminated transparent electrodes are promising candidates for building-integrated photovoltaics. However, the optical mechanisms governing their bidirectional performance remain...
Jul 2, 2026 | Application, Applications, Optical Metrology, Reflectance, Thin Film, Thin Film, Transmission, UV-VIS Absorption
P. A. Sánchez, S. Valdueza-Felip, M. Sun, F. B. Naranjo & Ó. Esteban Abstract We present a low-cost method to implement a single-layer antireflective coating (ARC) including metallic nanoparticles embedded into a polymer matrix. This ARC shows an almost flat...