StellarPro-TFC V2.1 OUT NOW!
We’ve been working hard to continue bringing you new and requested software updates. Check out the release notes below for the newest features in our Thin Film measurement software!
Key Updates
- Enhanced Stage Integration
Direct keyboard control for stage translation is now available, making sample positioning faster and easier during mapping operations. - Generate 3D Thin Film Thickness Interactive Plot
Display sample dimensions in the X and Y directions with local film thickness on the Z-axis. Built on interactive visualization tools, these plots can be opened in a browser and saved as HTML files for dynamic 3D analysis and sharing. - 2D Heatmap Image Export
Direct image export for 2D thickness heatmaps into standard graphic formats (.png, .jpg, .tiff). - Customizable Workspace Layouts
You can now arrange windows the way you want and save those layouts for later. Switching between different setups is quick, which helps if you’re working across multiple applications or workflows. - Additional Data Metrics
We’ve added new analysis options, including Area (Integral), Signal Ratio (A/B), and Area Ratio (A/B). These are available for supported spectrum types and make it easier to extract meaningful comparisons from your data. - Integrated Hardware Control
Control for light sources, shutters, and lasers is now built directly into the software. This keeps everything in one place and reduces the need for external tools during operation. - Multi-Channel and Processing Updates
Running multiple channels simultaneously is now supported with live graph display. Data processing has also been improved with per-channel control and the option to review data before applying processing steps. - Graphing and UI Updates
You now have more control over graph appearance, including line size, color, and scaling (manual or auto). We’ve also made general UI refinements and improved how settings are saved and restored between sessions.
Fixes and Stability Improvements
This release also addresses several issues we’ve seen in the field:
- Fixed hot pixel correction not applying during scans
- Resolved a Zaber stage issue where captures would not trigger
- Fixed HyperNova device detection issue related to driver identifiers
- Addressed issues with “Spectrometer Linker” item removal
- General bug fixes and performance improvements
StellarPro-TFC is included free with all StellarNet TF-Systems. StellarPro-TFC allows users to measure film thickness of multi-layer films.
Explore the New Thin Film Learning Center
Get more from your thin film measurement system with our new Thin Film Learning Center. Explore practical resources covering thin film metrology, measurement techniques, applications, and system capabilities. Whether you’re getting started with film thickness measurements or looking to expand your analysis capabilities, the Learning Center brings our technical resources together in one place.
About StellarNet
StellarNet designs rugged miniature spectrometers, spectroradiometers, Raman instruments, and optical measurement systems used worldwide in scientific research, renewable energy, industrial process monitoring, aerospace, education, and manufacturing. The company’s solutions combine high-performance optical instrumentation with intuitive software to deliver reliable spectral measurements from the laboratory to the field.