Dec 27, 2015 | Application, Optical Metrology, Physics
Organic semiconductor devices for micro-optical applications Martin Punke, Steffen Mozer, Marc Stroisch, Martina Gerken, Georg Bastian, Uli Lemmer, Dominik G. Rabus, and Patric Henzi Universität Karlsruhe (TH), Light Technology Institute (LTI), Institute for...
Dec 27, 2015 | Application, NIR, Optical Metrology, Physics
Optically thin composite resonant absorber at the near-infrared band: a polarization independent and spectrally broadband configuration –July 2011 KB Alici, AB Turhan, CM Soukoulis, and E Oz- Optics Express, 2011 We designed, fabricated, and experimentally...