10/15/2018
Array Detector Defects and Nonuniformities:
All array detectors, both 1D and 2D, will inevitably suffer from defects and pixel-to-pixel nonuniformities due to the limitations of high-volume semiconductor manufacturing processes. Even in the most tightly controlled semiconductor manufacturing processes, relatively small statistical variations have a large impact resulting in the appearance of dark pixels, hot pixels, and variations in pixel quantum efficiencies, due to the massive numbers of pixels involved. To put this into perspective let’s take a look at the typical scientific imaging camera with a 1024 x 1024 pixel CCD array from Andor Technology (a division of Oxford Instruments) which is specified to have a 0.008% dark pixel rate. While a statistical tolerance of this magnitude is extremely impressive, when you take into consideration that the array contains over 1 million individual pixels, that means that there are over 80 dark pixels which if clustered together can cause dark spots in your image.
Array Detector Testing and Characterization:
In either case, it is imperative to utilize a light source with extremely high spatial uniformity to avoid convolving light source variations with pixel variations. For this purpose here at StellerNet Inc, we have developed the uniform illumination sphere which provides a 2-inch diameter broadband output with an extremely uniform spatial power distribution shown in Figure 2 below. By placing the array at this opening, you are now able to guaranty that each pixel will see the exact same intensity ensuring the accuracy of the measured responsivity matrix.
aperture variation and (b) current tuning.
Conclusion:
As a result, it is obvious that the uniform illumination sphere light sources by StellerNet provide quality control engineers with an invaluable tool for the test and calibration of both 1D and 2D imaging arrays. This light source is available with StellarNet offers 10, 30, 50, & 75W NIST traceable bulb options depending on your testing requirements and comes with a NIST traceable calibrations certificate and spectral radiance and irradiance data from 300 nm – 1100nm in one-nanometer increments.




