Thin Film Measurement System
Thin Film Measurement System Page
StellarNet has announced a surprisingly low cost Thin Film thickness measurement system, covering a multitude of materials from 50Å-200μm thick. The non-contact measurement system includes portable, rugged hardware and reliable, user-friendly software. The large library of materials supports multilayer, freestanding, rough, thick and thin layer structures. Thickness is measured quickly and easily using reflectance spectroscopy with analysis provided in just seconds. With USB2 connectivity, the powerful thin film software package provides complex measurements via user configurable recipes and new materials can be easily added.
Each system includes spectrometer(s) required for measurement of desired thickness range. External light sources and a high quality reflectance probe (with stand) allow for ultra-sensitive reflectometry measurements. Thickness standards are also available in a variety of ranges, depending on the measurement needs. The measurement process consists of two steps: data acquisition and data analysis. TFCompanion defines all the processes in a measurement recipe and makes it transparent to the user.
StellarNet Thin Film measurement systems are ideal for Solar PV Films (TFPVs) including thin silicon, II-VI (primarily CdTe), CIGS, TCO stacks, and polyamides. On-line thickness measurements of oxides, silicon nitride and many other semiconductor process films are made quick and simple. Additionally, in-situ measurement during MEMS patterning processes provides photoresist uniformity and thickness. The system is also used by the automotive and aviation industries to measure thickness of protective films and hardcoats. Other typical applications include measurement of LCD & OLED displays, cell gaps, and thickness of rough layers on substrates such as steel, aluminum, brass, copper, or ceramics. From the most simple, routine measurements to multilayer, multi-sample analysis – this system is ready to provide quick, accurate analysis. Thin Film Measurement System Page
